Wen-Hsi Lee, Chi-Yi Su, Ying-Chieh Lee, Jackey Yang, Tony Yang and Shih-Pin Lin:

Effect of Inner Electrode on Reliability of (Zn,Mg)TiO₃-based Multilayer Ceramic Capacitor,

Japanese Journal of Applied Physics. 45 (2006) 5859-5864. (IF: 1.48)