Ying-Chieh Lee*, Hau Yang, Ting-Fu Hong, Huei-Jyun Shih & Wen-His Lee
The microstructure and electrical property of M-doped (M = W, Cr) NbN thin films
Journal of Materials Science: Materials in Electronics, 36:950 (2025) 1-13 (IF 3.5) 03 June 2025